Category: Metrology Subcategory: Surface Contamination
Manufacturer: KLA-Tencor Model: 4500
Equipment Name: 0588-243 Configuration:
Year: 3-6" wafers Condition: Excellent
Quantity: 1 Availability: In Stock, Immediately
Pricing: Call for Pricing Movie:
Description:
Surface Contamination Analyser Model # 4500 Non-patterned wafer inspection capable of up to 6” wafers (150mm) Will Configure for 2” wafers capabilities, including 2” pan assembly, realignment, calibration, cassette elevator modification. Sensitivity 0.21um defect detection 0.4 ppm Haze Sensitivity Accuracy within 1% Throughput for 150 mm wafers – 60 wph Color Histograms/bit maps System will meet OEM specifications System will be NIST Calibrated (calibration standards are not included with system) Operators Manual included
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