| KLA UV1250SE thin film measurement and UV Spectrospoic Ellipsometry system. This system is the ultimate single-solution tool which simultaneously measure film thickness, refractive index, extinction coefficient, for single-layer or multi-layer thin film stacks.
This system is a non-destructive optical characterization,& spectroscopic ellipsometry (SE)system,which combines the power of spectroscopic ellipsometry and the functionality of broadband UV spectrophotometry.
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